Dynamic light scattering (DLS) is a proven and mature technology for nanomaterial characterization, while nanoparticle tracking analysis (NTA) is a recent addition to the range of particle ...

Atomic force microscopy (AFM) is utilized for surface measurements with atomic-level resolution — dimensions that are much beyond the highest resolution of optical microscopes. AFM is known to be a ...

Periodic signal analysis enhances optics and photonics experiments using lock-in amplifiers and boxcar techniques.

In our earlier article 2 we explained that thermocouples generate a voltage/charge (V OUT) and do not require any voltage or current excitation. Readers familiar with the technology can jump to the ...