Business Wire

Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C-V, and Increased Parallel Testing to Semiconductor Parameter Analyzer

CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...
ascopubs.org

Cost-Effectiveness of Parallel Versus Sequential Testing of Genetic Aberrations for Stage IV Non–Small-Cell Lung Cancer in the Netherlands

Phase II Study of Afatinib in Patients With Tumors With Human Epidermal Growth Factor Receptor 2–Activating Mutations: Results From the National Cancer Institute–Molecular Analysis for Therapy Choice ...
Semiconductor Engineering

Time For Massively Parallel Testing

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...
EDN

Handbook explains parallel parametric testing

Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...
Semiconductor Engineering

Site-To-Site Variation In Parallel Test

From wafer to system level test, parallel test execution delivers significant benefits, including reduced costs, yet it’s never as simple as that PowerPoint slide you present to management. An ...